The HRDP Workshop serves as a premier meeting ground for the scientific community. Our goal is to create a dynamic, informal environment for exchanging ideas and tackling the latest challenges in atomic-layer and nanometric depth resolution.

The workshop emphasizes advanced ion beam techniques (LEIS/MEIS, RBS and ERDA among others), bridging the gap between fundamental ion–solid interactions and real-world applications.

Scope & Topics

We invite researchers to submit experimental and theoretical work covering a broad spectrum of interests:

1. Core Techniques & Instrumentation

• Low and Medium Energy Ion Scattering (LEIS/MEIS)

• Rutherford Backscattering Spectrometry (RBS) and Elastic Recoil Detection Analysis (ERDA)

• Secondary Ion Mass Spectroscopy (SIMS) and alternative methods

• Ion Detection in Helium Ion Microscopy & Atom Probe Tomography

• New facilities and instrumental developments

2. Applications & Materials Science

• Thin-film analysis and growth monitoring

• Nanostructured and semiconductor materials

• Quantitative analysis of biological surfaces and interfaces

• Surface and interface characterization at the atomic scale

3. Theory & Interdisciplinary Synergies

• Theoretical developments and new computer simulations

• Nuclear reaction profiling with atomic layer depth resolution

• Emerging techniques for ultra-shallow depth profiling

• Synergies with complementary methods (XPS, AFM, etc.)

We particularly encourage submissions from interdisciplinary areas where new challenges could inspire novel developments in ion beam analysis.